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Magazine Name : Ieee Design And Test Of Computers
Year : 1999Volume number : 16Issue:01
Itc Keynote: Test In The Emerging Intellectual Property Business.(Article) Subject:
Design & Test Of Computers
,
Itc Keynote:
Author:
Robin
Saxby
Peter
Harrod
page:
16
-
18
Guest Editors' Introduction:Dram Architecture And Testing.(Article) Subject:
Design & Test Of Computers
,
Guest Editors' Introduction
Author:
Bruce
F.Cockburn
Fabrizio
Lombardi
Fred
J.Meyer
page:
19
-
21
Faults Models And Test For A 2-Bit-Per-Cell Mldram.(Article) Subject:
Design & Test Of Computers
,
Fault Models
Author:
Michael
Redeker
Bruce
F.Cockburn
Duncan
G.Elliott
page:
22
-
31
Computational Ram: Implementing Processors In Memory.(Article) Subject:
Design & Test Of Computers
,
Computational Ram
Author:
Duncan
G.Elliott
Michael
Stumm
W.Martin
Snelgrove
Christian
Cojocaru
page:
32
-
41
Two High-Bandwidh Memory Bus Structures.(Article) Subject:
Design & Test Of Computers
,
Two High-Bandwidth
Author:
Bruce
Millar
Peter
Gillingham
page:
42
-
52
Universal Test Interface For Embedded-Dram Testing.(Article) Subject:
Design & Test Of Computers
,
Universal Test Interface
Author:
Shinji
Miyano
Katsuhiko
Sato
Kenji
Numata
page:
53
-
58
A Programmable Bist Core For Embadded Dram.(Article) Subject:
Design & Test Of Computers
,
A Programmable
Author:
Chih-Tsun
Huang
Jing-Reng
Huang
Chi-Feng
Wu
Cheng-Wen
Wu
page:
59
-
70
Estimating The Economic Benefits Of Dft.(Article) Subject:
Design & Test Of Computers
,
Estimating The Economic
Author:
Kenneth
M.Butler
page:
71
-
79